发明名称 FLAW INSPECTING DEVICE
摘要 PROBLEM TO BE SOLVED: To improve reliability by increasing detection precision, to reduce a space occupation rate, and to easily correct a position shift. SOLUTION: When a member 1 to be inspected is irradiated with the light from a light source 2 and its reflected light is picked up by an image pickup device (CAMERA) to detect whether or not there is a flaw, for example, three CAMERAs (31-33) are provided as shown in the figure and then the detection precision is increased to improve the reliability. Here, the space occupation rate is reduced by interposing beam splitters 41-43. Further, a position shift correction quantity is obtained from the outputs of the CAMERAs 31-33 and then a read address of a memory is determined according to the quantity, thereby easily correcting the position shift not by a mechanical method.
申请公布号 JPH0981736(A) 申请公布日期 1997.03.28
申请号 JP19950231699 申请日期 1995.09.08
申请人 FUJI ELECTRIC CO LTD 发明人 SANO YASUKAZU;KAIHO NAOKI
分类号 G01N21/88;G01N21/89;G01N21/892;G06T1/00;G06T7/00 主分类号 G01N21/88
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