发明名称 MEASURING METHOD BY SPECTRUM ANALYZER
摘要 PROBLEM TO BE SOLVED: To simply show time progress of noise level change by displaying the spectrum waveform of an input signal on one half part of a display screen and displaying noise on the other half part in a time domain. SOLUTION: A carrier frequency is positioned in the center of the left half of a display screen, and frequencies upward and downward separated by an offset value fof from the carrier frequency on both ends, and each spectrum therebetween is displayed. In other words, a spectrum waveform (frequency region) is displayed. In addition, the level of noise of a frequency fN upward separated by the offset value fof from the carrier frequency is displayed in time domain on the right half part of the display screen. In spectrum display for the frequency region of the left half part, frequency sweep is performed at least between fc±Fof in regard to an input signal, necessary parts are taken out from data taken in a backup memory and are displayed. Taken-in display of the data for the left part display and the other taken-in display of the data for the right part display are performed alternately.
申请公布号 JPH0980100(A) 申请公布日期 1997.03.28
申请号 JP19950231691 申请日期 1995.09.08
申请人 ADVANTEST CORP 发明人 FUKUI TAKAMASA;YAMASHITA KOICHI;YAMAGUCHI TAKAHIRO;AOYAMA OSAMU;KOSUGE TAKASHI;MIYAMAE YOSHIAKI;KASAHARA TOSHIHARU;TAKAOKU HIROAKI
分类号 G01R23/173;G01R29/26;(IPC1-7):G01R29/26 主分类号 G01R23/173
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