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发明名称
METHOD FOR DETERMINING TEST POINT OF XY IN-CIRCUIT TESTER
摘要
申请公布号
JPH0980117(A)
申请公布日期
1997.03.28
申请号
JP19950232248
申请日期
1995.09.11
申请人
PFU LTD
发明人
OKAMOTO HIROSHI
分类号
G01R31/02;G01R1/06;G01R31/28;(IPC1-7):G01R31/28
主分类号
G01R31/02
代理机构
代理人
主权项
地址
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