发明名称 INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To detect which part of an integrated circuit failures and to which lead terminal of the integrated circuit the failing circuit corresponds, by setting a failure diagnosis circuit part in the integrated circuit. SOLUTION: If an integrated circuit part, for example, 51a breaks down because of an excess current or static electricity impressed to the integrated circuit part, a diagnosis diode 41a corresponding to a lead terminal 12a of the integrated circuit part 51a is also broken down at the same time. The breakdown of the diode 41a brings about a short circuit and, the diode 41a having been connected in an opposite direction and shut a current from the integrated circuit part is substituted with a conductive wire 41aa as indicated by a chain line. It can be confirmed that the IC(internal) circuit 51a corresponding to the short-circuited lead terminal 12a fails by inspecting connections between a failure diagnosis lead terminal 14 of the integrated circuit and each of the lead terminals of the integrated circuit part.
申请公布号 JPH0980120(A) 申请公布日期 1997.03.28
申请号 JP19950237290 申请日期 1995.09.14
申请人 FUJITSU TEN LTD 发明人 YOKOYAMA MASAO
分类号 G01R31/26;G01R31/28;H01L21/66;H01L21/822;H01L27/04;(IPC1-7):G01R31/28 主分类号 G01R31/26
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