发明名称 Contacting temp. probe head with contact surface
摘要 The head with its contact surface extending essentially in correspondence with a projection surface of this probe head, and this projection surface corresponds or nearly corresponds to the largest projection surface of temp. probe head (1). The contacting temp. probe has a plane contact section, a plane contact surface on the plane contact section, a hollow chamber (5) in the plane contact section and a temp. sensitive unit (6a,6b) is arranged in this hollow chamber. A probe head holder (2) is provided and arranged so that between the probe head and the holder, point or line contact exists.
申请公布号 DE19638117(A1) 申请公布日期 1997.03.27
申请号 DE19961038117 申请日期 1996.09.18
申请人 FUSION SYSTEMS CORP., ROCKVILLE, MD., US 发明人 WOOTEN, DAVID, ROCKVILLE, MD., US;KREIN, BRUCE, OLNEY, MD., US;SHI, JIANOU, STATE COLLEGE, PA., US
分类号 G01J5/12;G01J5/14;G01K1/14;G01K7/02;(IPC1-7):G01J5/12 主分类号 G01J5/12
代理机构 代理人
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