摘要 |
The head with its contact surface extending essentially in correspondence with a projection surface of this probe head, and this projection surface corresponds or nearly corresponds to the largest projection surface of temp. probe head (1). The contacting temp. probe has a plane contact section, a plane contact surface on the plane contact section, a hollow chamber (5) in the plane contact section and a temp. sensitive unit (6a,6b) is arranged in this hollow chamber. A probe head holder (2) is provided and arranged so that between the probe head and the holder, point or line contact exists.
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申请人 |
FUSION SYSTEMS CORP., ROCKVILLE, MD., US |
发明人 |
WOOTEN, DAVID, ROCKVILLE, MD., US;KREIN, BRUCE, OLNEY, MD., US;SHI, JIANOU, STATE COLLEGE, PA., US |