CMOS Integrated circuits and test method and apparatus therefor,申请号GB19970002379-传众专利搜索

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发明名称	CMOS Integrated circuits and test method and apparatus therefor
摘要
申请公布号	GB9702379(D0)	申请公布日期	1997.03.26
申请号	GB19970002379	申请日期	1997.02.05
申请人	NEC CORPORATION	发明人
分类号	G01R31/319;G01R31/26;G01R31/30;G01R31/3193;G06F11/22	主分类号	G01R31/319
代理机构		代理人
主权项
地址

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