发明名称 Method and apparatus for testing delta-sigma modulators
摘要 <p>A delta-sigma modulator (14) is tested by sampling an input test signal at a first rate (in 24) and inputting the samples to the delta-sigma modulator under test so that the modulator outputs a digital signal representative of each sample. The input signal is also sampled at a second rate (in 26) and an error factor is then established (by 28) in accordance with the difference between the value of the output signal produced by the delta-sigma modulator and the value of the sample obtained by sampling the input signal at the second rate. By comparing the error factor to a prescribed value, the proper operation of the delta-sigma modulator can be verified. <IMAGE></p>
申请公布号 EP0458515(B1) 申请公布日期 1997.03.26
申请号 EP19910304333 申请日期 1991.05.15
申请人 AT&T CORP. 发明人 TSAI, SHENG-JEN
分类号 G01R29/26;G01R31/00;H03M1/10;H03M3/02;(IPC1-7):H03M1/10 主分类号 G01R29/26
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