发明名称 |
Boundary-scan bypass circuit for integrated circuit electronic component and circuit boards incorporating such circuits and components |
摘要 |
A method and apparatus for bypassing a boundary-scan cell during functional operation of an electronic component provides a component output signal (such as a data signal) to a boundary-scan bypass circuit during normal functional operation of the electronic component. The component output signal is multiplexed in the bypass circuit with the test result signal that occurs during boundary-scan testing. During functional operation of the electronic component, the component output signal is selected and provided to an output latch that is clocked by a transition of the clock signal of the electronic component. By bypassing the component output signal around the boundary-scan cell during normal operation, the traversing of the multiplexer by the component output signal after the transition of the clock signal of the component is avoided, thereby reducing off-chip delay.
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申请公布号 |
US5615217(A) |
申请公布日期 |
1997.03.25 |
申请号 |
US19940352080 |
申请日期 |
1994.12.01 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
HORNE, RICK L.;LOHMAN, TERENCE J.;NOLL, MARK G.;OLIVE, JOSE A.;PEREZ, ROBERTO V. |
分类号 |
G01R31/3185;(IPC1-7):G01R31/28 |
主分类号 |
G01R31/3185 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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