| 摘要 |
Interferometric system for the detection and location of reflector faults of light-guiding structures. This system has a first interferometer comprising an incoherent light source (4), an optical coupler (6) connected to the source and to the structure (2), means (18a, 18b) for the displacement of a support (16) in translation at constant speed, a reflector (24) fixed to the support, photodetection means (26) supplying during a translation of the support an interferogram for a reflector fault of the structure, pulse generating means (28 to 48) and means (50) which sample the interferogram by pulses, which store the samples obtained and locate the reflector faults.
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