发明名称 |
METHOD OF MANUFACTURE OF COMPOUND SEMICONDUCTOR DEVICE |
摘要 |
A fabrication method of compound semiconductor device using high quality gold plating is disclosed. The method comprises the steps of: sequentially forming a first conducting layer(11) and a second conducting layer(12) on a compound semiconductor substrate(1); forming a gold pattern(4) on an exposed conducting layers by plating using a photoresist pattern(13) as a mask; forming a capping layer(21) on the gold pattern(4) and the photoresist pattern(13); removing the photoresist pattern(13); and etching the exposed first and second conducting layer(11, 12) using the remained capping layer(21) as a mask. Thereby, it is possible to decrease the number of mask and easily form fine and high quality gold pattern.
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申请公布号 |
KR970003692(B1) |
申请公布日期 |
1997.03.21 |
申请号 |
KR19930024047 |
申请日期 |
1993.11.12 |
申请人 |
HYUNDAI ELECTRONICS IND.CO.,LTD. |
发明人 |
KIM, ANG-SEO;KIM, NAM-JOON;YU, SOON-JAE |
分类号 |
H01L21/60;(IPC1-7):H01L21/60 |
主分类号 |
H01L21/60 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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