SEMICONDUCTOR WAFER AND METHOD OF MANUFACTURING THE SAME, AND SEMICONDUCTOR DEVICE AND TEST BOARD OF THE SAME,申请号KR19930011330-传众专利搜索

发明名称	SEMICONDUCTOR WAFER AND METHOD OF MANUFACTURING THE SAME, AND SEMICONDUCTOR DEVICE AND TEST BOARD OF THE SAME
摘要
申请公布号	KR970003728(B1)	申请公布日期	1997.03.21
申请号	KR19930011330	申请日期	1993.06.21
申请人	MITSUBISHI ELECTRIC KK.	发明人	NAKKAJIMA, NITCHIO
分类号	G01R31/26;G01R31/28;H01L21/326;H01L21/66;H01L21/822;H01L27/04;(IPC1-7):H01L21/66	主分类号	G01R31/26
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