发明名称 Verfahren und Vorrichtung zur optoelektronischen Abtastung
摘要 The invention pertains to a process and device for the optoelectronic scanning of originals. An original (4) is scanned by pixels and lines with the aid of a photodiode line (7). The picture signal values thus obtained for the individual pixels of the scanned lines are read from the integrated shift register (11) of the photodiode-line (7) and fed sequentially to an analogue-digital converter (17). The analogue-digital converter (17) converts only a proportion of the picture signal values from the original (4) to digital picture values for further processing; that proportion is defined by an original extract whose size and shape can be selected. To increase the scanning speed, the picture signal values which are to be converted to digital picture values are read from the shift register (11) at a speed which corresponds to the permissible operating speed of the analogue-digital converter (17) and fed to the latter. Those picture signal values not subject to conversion to digital picture values are read from the shift register (11) at a considerably higher speed.
申请公布号 DE19534334(A1) 申请公布日期 1997.03.20
申请号 DE19951034334 申请日期 1995.09.15
申请人 LINOTYPE-HELL AG, 65760 ESCHBORN, DE 发明人 ALBRECHT, UWE, 24109 KIEL, DE;BRUEGGE, WOLFGANG, 24113 MOLFSEE, DE;SCHIELKE, RAINER, 24357 FLECKEBY, DE
分类号 H04N1/04;H04N1/38;(IPC1-7):H04N1/41 主分类号 H04N1/04
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