| 发明名称 |
DISTRIBUTED PSEUDO RANDOM SEQUENCE CONTROL FOR LSI/VLSI TEST SYSTEMS |
| 摘要 |
Simple polynomial function generators are used to generate pseudo random test patterns and perform signature analysis on a per pin basis in the control logic in LSI/VLSI test systems. |
| 申请公布号 |
KR970003524(B1) |
申请公布日期 |
1997.03.18 |
| 申请号 |
KR19880011801 |
申请日期 |
1988.09.13 |
| 申请人 |
TEXAS INSTRUMENTS INCORPORATED |
发明人 |
MYDILI, MARC R.;POWELL, THEO J |
| 分类号 |
G06F11/22;G01R31/28;G01R31/3181;G01R31/3183;G06F11/277;(IPC1-7):G01R31/28 |
主分类号 |
G06F11/22 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
|
| 地址 |
|
