发明名称 Plasma etching of semiconductors
摘要 A dry etching process for use in the manufacture of silicon integrated circuit devices uses a mixture of about eight parts neon to one part CHF3 (Freon 23) to form the etching plasma. The process etches doped oxides of silicon, such as BPSG and BPTEOS, in preference to undoped oxides of silicon, silicon nitride, silicides and silicon.
申请公布号 US5611888(A) 申请公布日期 1997.03.18
申请号 US19960657586 申请日期 1996.06.07
申请人 LAM RESEARCH CORPORATION 发明人 BOSCH, WILLIAM F.;ZHU, HELEN;HAIDER, SYED A.
分类号 H01L21/311;(IPC1-7):H01L21/00 主分类号 H01L21/311
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