发明名称 Semiconductor integrated circuit which prevents malfunctions caused by noise
摘要 In a semiconductor integrated circuit device, a MOS transistor has a relatively high built-in threshold, and in operation, a substrate bias is applied to the MOS transistor so as to cause the MOS transistor to forcibly have a reduced threshold, so that the MOS transistor operates at a high speed with the reduced threshold. When noise is detected, application of the substrate bias is stopped so that the MOS transistor restores the relatively high built-in threshold, and simultaneously, the MOS transistor is put in a standby condition, so that a malfunction can be prevented with the relatively high built-in threshold.
申请公布号 US5612643(A) 申请公布日期 1997.03.18
申请号 US19960618730 申请日期 1996.03.20
申请人 NEC CORPORATION 发明人 HIRAYAMA, TAKESHI
分类号 H01L27/04;G06F11/00;H01L21/822;H01L21/8238;H01L27/02;H01L27/092;H03K19/00;H03K19/003;(IPC1-7):G05F3/02 主分类号 H01L27/04
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