| 摘要 |
<p>A method for determining the relative positions of a plurality of layers of a multilayer circuit board, whereby each layer is provided with a number of marks. Reference holes are drilled through superimposed marks of several layers and the position of the mark of each layer relative to the reference hole is measured at each reference hole by means of a measuring pin on the basis of material transitions in said mark, after which the relative positions of the layers with respect to each other are calculated. The position of a mark is measured by means of a measuring pin provided with a sensor, whereby the sensor is rotated and translated in the reference hole by means of the measuring pin.</p> |
