| 摘要 |
A handler for facilitating the inputting of the testing conditions of each lot of ICs to be tested. The apparatus includes a test parameter memory (8a) for storing, as testing conditions of each lot, parameters of at least basic operation conditions, parameters of tested IC classifying conditions, parameters of socket selecting conditions for a testing section and parameters of temperature conditions for a constant-temperature tank, a parameter set memory (8b) for storing parameter sets, i.e., combinations of parameters, stored in the test parameter memory, a schedule memory (8c) is which the name of each lot and the corresponding parameter sets and status are written in order of test, a lot data memory (8d) for storing the data on the results of the test on each lot, a re-inspection data memory (8e) in which re-testing data including the parameter sets for the device to be re-tested are written, and a control unit (6) for controlling the operation of each part, routinely used parameter sets are stored in the parameter set memory in advance.
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