发明名称 Signal propagation delay calibration circuit for semiconductor testing
摘要 The circuit has each calibration loop formed with a common delay time counter (82), OR gate (75) and buffer (76), delay elements (78,55), gate circuits (52,56) and coaxial cables (40,45). A pulse from the clock generator (90) circulates in a feedback loop in accordance with a delay for each test channel. The delay time is adjusted to be equal to a basic delay or a delay in another loop. Each loop has an output connection to an associated signal path, and the delays in all loops are brought to a constant value.
申请公布号 DE19636916(A1) 申请公布日期 1997.03.13
申请号 DE19961036916 申请日期 1996.09.11
申请人 ADVANTEST CORP., TOKIO/TOKYO, JP 发明人
分类号 G01R31/28;G01R31/317;G01R31/319;G01R35/00;(IPC1-7):G01R31/26;G04G1/00 主分类号 G01R31/28
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