TEM waveguide for electromagnetic interference characteristics testing

摘要

The invention concerns a TEM waveguide (1) with a test zone (2) for testing the electromagnetic properties of a test specimen, a TEM wave being guided along an inner and an outer line (3, 4) and absorbed at one end of the TEM waveguide (1) by an HF absorber or HF absorber wall which absorbs the field-dependent energy and, optionally, by an ohmic line termination designed to absorb the line-dependent TEM-wave energy. The waveguide is characterized in that at least one section (3b) of the inner line (3) can be rotated relative to the other line (4) so that the field polarization with respect to the specimen in the test zone (2) is changed.