发明名称 Schottky barrier diode
摘要 <p>A Schottky barrier diode (52) having improved breakdown characteristics has an n&lt;+&gt; semiconductor layer (1) and an n&lt;-&gt; semiconductor layer (2) provided on the n&lt;+&gt; semiconductor layer (1). The n&lt;-&gt; semiconductor layer (2) is configured to form a mesa. An insulating layer (8) is formed so as to expose the upper surface of the mesa. An anode electrode (4) is provided on the exposed surface and a side surface of the mesa, while a cathode (5) is electrically connected to the n&lt;+&gt; layer. A plasma treated layer (9) is provided in the n&lt;-&gt; semiconductor layer (2) so as to extend inwardly from at least a portion of the side surface of the mesa. &lt;IMAGE&gt;</p>
申请公布号 EP0762512(A1) 申请公布日期 1997.03.12
申请号 EP19960113586 申请日期 1996.08.23
申请人 MURATA MANUFACTURING CO., LTD. 发明人 MIYATA, TOMOYASU;SAKAMOTO, KOICHI
分类号 H01L21/329;H01L29/47;H01L29/861;H01L29/872;(IPC1-7):H01L29/872 主分类号 H01L21/329
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