发明名称 |
Schottky barrier diode |
摘要 |
<p>A Schottky barrier diode (52) having improved breakdown characteristics has an n<+> semiconductor layer (1) and an n<-> semiconductor layer (2) provided on the n<+> semiconductor layer (1). The n<-> semiconductor layer (2) is configured to form a mesa. An insulating layer (8) is formed so as to expose the upper surface of the mesa. An anode electrode (4) is provided on the exposed surface and a side surface of the mesa, while a cathode (5) is electrically connected to the n<+> layer. A plasma treated layer (9) is provided in the n<-> semiconductor layer (2) so as to extend inwardly from at least a portion of the side surface of the mesa. <IMAGE></p> |
申请公布号 |
EP0762512(A1) |
申请公布日期 |
1997.03.12 |
申请号 |
EP19960113586 |
申请日期 |
1996.08.23 |
申请人 |
MURATA MANUFACTURING CO., LTD. |
发明人 |
MIYATA, TOMOYASU;SAKAMOTO, KOICHI |
分类号 |
H01L21/329;H01L29/47;H01L29/861;H01L29/872;(IPC1-7):H01L29/872 |
主分类号 |
H01L21/329 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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