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摘要 PURPOSE:To prevent damage to a wafer by a method wherein a process to punch out a resin film with size larger than that of a semiconductor substrate while molten-removing the jutting out portion of the resin film using a heating wire as well as another process to peel off the resin film from semiconductor substrate using a bonding tape, are provided. CONSTITUTION:A resin film 5 is pressed down upon the surface of Si wafers 2 by an automatic push roller 18 at specified optimum pressure to punch out the Si wafers 2 along a circular guide larger than the Si wafers 2 continuously stuck on the tape of resin film 5. Later, the Si wafers 2 with a Ni-Cr wire heater 24 pressed down upon the edge of Si wafers 2 by spring 27 pressure are turned to cut off the jutting out resin film 5 from the Si wafers 2 cleanly along the edge of Si wafers 2 without fail. After pressing down a bonding tape 31 upon the resin film 5 by a pressure fixing roller 32, the bonding tape 31 can be wound up from the end thereof so that the resin film 5 may be peeled off from the wafers 2 due to the higher adhesion of bonding tape 31 than that of the resin film 5.
申请公布号 JP2589678(B2) 申请公布日期 1997.03.12
申请号 JP19860207259 申请日期 1986.09.03
申请人 MATSUSHITA ELECTRONICS CORP 发明人 SHINOHARA AKIRA;TAKESHIMA SHUJI;SATO FUMIO
分类号 H01L21/304;B24B7/07;B65H29/54;B65H37/04;B65H41/00;H01L21/67;H01L21/68;H01L21/683 主分类号 H01L21/304
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