发明名称 MANUFACTURING METHOD FOR FERROELECTRIC THIN FILM, DIELECTRIC THIN FILM AND INTEGRATED CIRCUIT CONTAINING FERROELECTRIC THIN FILM
摘要 PROBLEM TO BE SOLVED: To lower temperature and to speed up time for film-formation and to reduce leak current, in a film formation method, by a sol-gel method or an MOD method, for a ferroelectric thin film or a dielectric thin film consisting of a bismuth layer structured compound material. SOLUTION: A stage (step 1) wherein the precursor solution which contains at least a kind of metal and consists of metallic complex salt in solvent is applied on a film consisting of one or more layers on a substrate, for forming a thin film, a stage (step 2) wherein the thin film is dried for removing the solvent of the precursor solution, and a stage (step 3) wherein, with no stage wherein a thin film under amorphous condition is formed, the organic substance in the thin film is heated up above crystallization temperature at the speed above a specified temperature increase speed for crystallizing the thin film material, while the organic substance removed by thermal decomposition, are included in a thin film manufacturing method.
申请公布号 JPH0969614(A) 申请公布日期 1997.03.11
申请号 JP19950225251 申请日期 1995.09.01
申请人 SHARP CORP 发明人 USHIKUBO MAHO;ITO YASUYUKI;YOKOYAMA SEIICHI;OGIMOTO YASUSHI;OGATA NOBUHITO;KOBA MASAYOSHI
分类号 C01G35/00;C30B29/22;H01G4/33;H01L21/316;H01L21/8242;H01L21/8246;H01L21/8247;H01L27/10;H01L27/105;H01L27/108;H01L29/788;H01L29/792 主分类号 C01G35/00
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