发明名称 |
Method to observe film thickness and/or refractive index by color difference |
摘要 |
To observe film thickness and/or refractive index of a sample, light beams from a white light source are irradiated onto the surface of the solid or liquid sample such that the reflected light beams are colored by partial extinction of the reflected light beams. A difference 17 film thickness and/or refractive index of the sample is observed according to color difference of the reflected light beams.
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申请公布号 |
US5610392(A) |
申请公布日期 |
1997.03.11 |
申请号 |
US19950537117 |
申请日期 |
1995.09.29 |
申请人 |
RESEARCH DEVELOPMENT CORPORATION OF JAPAN |
发明人 |
NAGAYAMA, KUNIAKI;ADACHI, EIKI |
分类号 |
G01B11/06;G01N21/21;G01N21/41;G01N21/84;(IPC1-7):G01N21/21;G01J3/50 |
主分类号 |
G01B11/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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