发明名称 Method to observe film thickness and/or refractive index by color difference
摘要 To observe film thickness and/or refractive index of a sample, light beams from a white light source are irradiated onto the surface of the solid or liquid sample such that the reflected light beams are colored by partial extinction of the reflected light beams. A difference 17 film thickness and/or refractive index of the sample is observed according to color difference of the reflected light beams.
申请公布号 US5610392(A) 申请公布日期 1997.03.11
申请号 US19950537117 申请日期 1995.09.29
申请人 RESEARCH DEVELOPMENT CORPORATION OF JAPAN 发明人 NAGAYAMA, KUNIAKI;ADACHI, EIKI
分类号 G01B11/06;G01N21/21;G01N21/41;G01N21/84;(IPC1-7):G01N21/21;G01J3/50 主分类号 G01B11/06
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