| 摘要 |
Apparatus and methods for generating z-axis profiles for a CT system detector are described. In one form, the method includes the steps of directing x-ray beams having different z-axis centroids and slice thicknesses at the detector and collecting detector signals for each beam. The detector signal for a first beam is then subtracted from the detector signal for a second beam to obtain a differential, or composite, detector signal which corresponds to a third beam having yet another z-axis centroid and slice thickness. The full z-axis profile of the detector is generated from measured detector signals and composite detector signals.
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