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发明名称
SEMICONDUCTOR DEVICE AND ITS TESTING METHOD
摘要
申请公布号
JPH0961497(A)
申请公布日期
1997.03.07
申请号
JP19950220442
申请日期
1995.08.29
申请人
MITSUBISHI ELECTRIC CORP
发明人
SUMA KATSUHIRO
分类号
G01R31/26;G01R31/28;G01R31/3185;G11C29/00;G11C29/56;H03K5/08;(IPC1-7):G01R31/28
主分类号
G01R31/26
代理机构
代理人
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