| 摘要 |
PROBLEM TO BE SOLVED: To achieve a testing of a semiconductor IC device inexpensively at a sufficient operation speed. SOLUTION: An external interface 3 is supplied with a digital test data DI and a scan clock SCCK. A clock generation circuit 4 outputs a test clock TCK with a higher frequency than the clock SCCK. The interface 3 allows accessing of a status holding means 2 to hold the test data DI based on the scan clock SCCK. The interface 3 also lets an internal circuit block 1 operate based on the clock TCK while an output data DO outputted from the internal circuit block 1 is held based on the clock TCK by accessing the status holding means 2. Moreover, the external interface 3 serves to output the output data DO held by the status holding means 2 based on the clock SCCK. |
