Verfahren zum Kompensieren des durch eine äußere Einflußgröße verursachten Fehlverhaltes von Meßeinrichtungen

摘要

The invention relates to a process for compensating for the incorrect operation of measuring devices fitted with a programming section caused by external influences in which the measuring devices together with a sensor responding to the influence are fitted in a chamber exposed to said influencing factor. When the influencing factor changes, measurements from the measuring device and the sensor are detected by a data processing system which provides the programming section of the measuring devices with signals compensating for the incorrect operation caused by said influencing factor. In order to be able to perform such a process rapidly and thus economically, the influencing factor is continuously changed and the current output value of the sensor (6) and the current measurement provided by the measuring device (3) are detected with a timing predetermined by the data processing system.