发明名称 Method of depositing oxide film
摘要 Al, B or Al-B silicate glass film is deposited on a substrate by sputtering Si in an atmosphere <FORM:1096925/C6-C7/1> containing A, O2 and volatile alkoxides or alkyds e.g. B isopropylate, Al ethoxide and Al isopropoxide. In a vacuum chamber 10 the substrate 13 e.g. a semi-conductor is mounted on a steel, water cooled, grounded anode 12 beneath a cathode 11 attached to a heat sink 15 and shielded by screen 14. The sputtering rate may be increased by a magnetic field. The volatile compounds are introduced by bubbling A and O2 through B isopropylate and A ethoxide in tank 23 or over the frozen liquid.ALSO:<PICT:1096925/C1/1> Al, B or Al-B silicate glass film is deposited on a substrate by sputtering Si in an atmosphere containing A, O2 and volatile alkoxides or alkyds e.g. B isopropylate, Al ethoxide and Al isopropoxide. In a vacuum chamber 10 the substrate 13 e.g. a semi-conductor is mounted on a steel, water-cooled, grounded anode 12 beneath a cathode 11 attached to a heat sink 15 and shielded by screen 14. The sputtering rate may be increased by a magnetic field. The volatile compounds are introduced by bubbling A and O2 through B isopropylate and A ethoxide in tank 23 or over the frozen liquid.
申请公布号 GB1096925(A) 申请公布日期 1967.12.29
申请号 GB19650027641 申请日期 1965.06.30
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人
分类号 C03C1/00;C03C17/02;C23C14/00;H01B3/08;H01L21/316;H01L23/31 主分类号 C03C1/00
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