发明名称 Method of etching titanium nitride and insulating oxide layers using a gas comprising carbon-fluoride and carbon-oxide.
摘要 A process for etching TiN on a substrate comprises: placing the substrate in a process zone and exposing it to a gaseous etchant consisting of a carbon-fluoride gas and a carbon oxygen gas under plasma conditions. Also claimed is a method as above for etching a TiN layer overlain by an insulative oxide layer, using a plasma formed in a C2F6/CO etchant. Further claimed is a method for etching the insulative oxide by a carbon-fluoride etchant-gas plasma, exhausting the gaseous by-products so-formed, and then etching the TiN by a plasma in a CH3F/CO2 etchant.
申请公布号 EP0665583(A3) 申请公布日期 1997.03.05
申请号 EP19950100970 申请日期 1995.01.25
申请人 APPLIED MATERIALS, INC. 发明人 KESWICK, PETER R.;MARKS, JEFFREY
分类号 C04B41/91;H01L21/302;H01L21/3065;H01L21/3213 主分类号 C04B41/91
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