发明名称 |
Method of etching titanium nitride and insulating oxide layers using a gas comprising carbon-fluoride and carbon-oxide. |
摘要 |
A process for etching TiN on a substrate comprises: placing the substrate in a process zone and exposing it to a gaseous etchant consisting of a carbon-fluoride gas and a carbon oxygen gas under plasma conditions. Also claimed is a method as above for etching a TiN layer overlain by an insulative oxide layer, using a plasma formed in a C2F6/CO etchant. Further claimed is a method for etching the insulative oxide by a carbon-fluoride etchant-gas plasma, exhausting the gaseous by-products so-formed, and then etching the TiN by a plasma in a CH3F/CO2 etchant. |
申请公布号 |
EP0665583(A3) |
申请公布日期 |
1997.03.05 |
申请号 |
EP19950100970 |
申请日期 |
1995.01.25 |
申请人 |
APPLIED MATERIALS, INC. |
发明人 |
KESWICK, PETER R.;MARKS, JEFFREY |
分类号 |
C04B41/91;H01L21/302;H01L21/3065;H01L21/3213 |
主分类号 |
C04B41/91 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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