Raster-Mikroskop mit einem Kraftfühler,申请号DE1992612576T-传众专利搜索

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发明名称	Raster-Mikroskop mit einem Kraftfühler
摘要
申请公布号	DE69212576(T2)	申请公布日期	1997.02.27
申请号	DE1992612576T	申请日期	1992.10.26
申请人	AT & T CORP., NEW YORK, N.Y., US	发明人	BETZIG, ROBERT ERIC, CHATHAM, NEW JERSEY 07928, US
分类号	G01B21/30;G01B7/34;G01L1/00;G01Q10/06;G01Q20/02;G01Q20/04;G01Q30/04;G01Q60/06;G01Q60/22;G01Q60/26;G01Q70/18;G02B21/00;(IPC1-7):G01B7/34	主分类号	G01B21/30
代理机构		代理人
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