发明名称 ATM CELL TESTER
摘要 PROBLEM TO BE SOLVED: To provide an ATM tester capable of easily causing deterioration of ATM cell transfer, easily testing ATM cell transfer characteristics of an ATM communication system and measuring and testing characteristics by ATM communication service kinds. SOLUTION: This ATM cell tester is provided with an ATM cell generating means 7 which generates an ATM cell by itself and sends it out, a cell transfer loss generating means 11 which causes the header part of the ATM cell to deteriorate, a cell transfer error generating means 12 which causes the information part of the ATM cell to deteriorate, a cell mixing means 13 which mixes the ATM cell supplied from the ATM cell generating means 7 with a received ATM cell flow, a cell transfer delay means 14 which causes time delay of the ATM cell, and a condition setting means 15 which sets generation conditions of the deterioration of the ATM cell for the respective means.
申请公布号 JPH0955741(A) 申请公布日期 1997.02.25
申请号 JP19950204311 申请日期 1995.08.10
申请人 NIPPON TELEGR & TELEPH CORP <NTT> 发明人 YAMADA TAKUMI;KUBOYAMA YOSHIO;HIROSE TOSHIAKI
分类号 H04M3/26;H04L12/26;H04L12/28;H04L29/14;H04Q3/00;(IPC1-7):H04L12/28 主分类号 H04M3/26
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