发明名称 Pattern transfer techniques for fabrication of lenslet arrays for solid state imagers
摘要 A method for forming lenslets which collect light and focuses it onto photosensitive elements of an electronic imager includes providing a transparent lenslet-forming layer on a substrate or on layers on the substrate and forming a thin etch-stop layer on the transparent lenslet-forming layer and patterning the etch-stop layer so that the mask pattern corresponds to lenslets to be formed, The method further includes anisotropically plasma etching the transparent lenslet-forming layer according to the thin etch-stop mask pattern, removing the thin etch-stop mask, and thermally reflowing the patterned transparent layer to form the transparent lenslets.
申请公布号 US5605783(A) 申请公布日期 1997.02.25
申请号 US19950369235 申请日期 1995.01.06
申请人 EASTMAN KODAK COMPANY 发明人 REVELLI, JOSEPH F.;HIRSH, JEFFREY I.;JECH, JOSEPH;ROBELLO, DOUGLAS R.;BARRY, STEPHEN P.;NUTT, ALAN C. G.
分类号 G02B3/00;G02B6/12;G02B6/122;G02B6/124;G03F7/00;H01L27/146;(IPC1-7):G03F7/40 主分类号 G02B3/00
代理机构 代理人
主权项
地址
您可能感兴趣的专利