发明名称 LASER PROBE DEVICE
摘要 PROBLEM TO BE SOLVED: To embody an excellent laser probe device which is used for a laser beam treatment, is lessened in output loss, prevents an optical fiber from being contaminated with transpired matter and is hardly susceptible to overheat damage. SOLUTION: This laser probe device has an optical cable A in which the optical fiber 1 is built, a hand piece B in which this optical cable A is housed, a front end chip C which is mounted at the front end of this hand piece B and a condenser lens 7 which is mounted at the inside wall of an attaching and detaching part 8. Since the laser beam emitted from the front end face of the optical fiber 1 is made incident at a shallow angle nearly parallel beams on the front end chip C via this condenser lens 7, the number of reflection times of the laser beam on the inside surface of the front end chip C is decreased and the output loss is lessened. Since the direct adhesion of the transpired matter on the optical fiber 1 is prevented, the possibility of the contamination is eliminated. Further, the position of the optical cable A may be far parted distant from the front end chip C and, therefore, the damage by the overheat of the optical fiber 1 is lessened.
申请公布号 JPH0951899(A) 申请公布日期 1997.02.25
申请号 JP19950227241 申请日期 1995.08.11
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 TANAKA AKIO
分类号 A61B18/20;A61N5/06 主分类号 A61B18/20
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