发明名称 Method for controlling the surface state of one face of a solid and the associated device
摘要 PCT No. PCT/FR94/01277 Sec. 371 Date Jul. 26, 1995 Sec. 102(e) Date Jul. 26, 1995 PCT Filed Nov. 4, 1994 PCT Pub. No. WO95/12810 PCT Pub. Date May 11, 1995A method and apparatus for checking the surface state of one face (2) of a solid (1) in order to locate shape defects which may be present therein. The observation of the face to be checked takes place by means of photography using a large field video camera (3) and a small field video camera (4). The size of the located defects is measured by an optoelectronic sensor or probe (11). The apparatus can be controlled by an operator or can have automatic control.
申请公布号 US5606410(A) 申请公布日期 1997.02.25
申请号 US19950436349 申请日期 1995.07.26
申请人 COMPAGNIE GENERALE DES MATIERES NUCLEAIRES 发明人 PECLIER, ROGER;LAURENT, PIERRE;PIQUARD, JEAN-FRANCOIS
分类号 G01B11/30;G01N21/88;G01N21/93;G21C17/06;(IPC1-7):G01N21/00 主分类号 G01B11/30
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