INTEGRATED CIRCUIT WITH TEST CIRCUIT AND TESTING METHOD

摘要

PROBLEM TO BE SOLVED: To improve testability by enabling a microprocessor core to be tested with a standard AVP by providing a rest mode matrix circuit which controls the signal transmission route of an integrated circuit device. SOLUTION: A test mode matrix 340 connects a microprocessor core 310, a logic circuit 320 for specific application and an I/O circuit 330 mutually. As a result, the processor core 310 is tested by connecting an external test device to the I/O circuit 330 and using a standard test vector, and the system test and debug of the logic circuit 320 and a code are performed by connecting an ICE to the I/O circuit 330. The test mode matrix 340 performs the required connection of the processor core 310 and the logic circuit 320 without passing any signal through an off-chip driver/receiver and furthermore, without passing through a three-state element, which maintains perfect testability consequently.