发明名称 |
Planarized gate conductor on substrates with above-surface isolation |
摘要 |
Stringers and depth of focus problems in substrates having above-surface isolation schemes are avoided by applying a first portion of a gate conductor over the entire surface having above-surface isolation, selectively removing the gate conductor from above the isolation features of the above-surface isolation, and overcoating the entire surface with a second portion of gate conductor. The process has particular application to substrates that employ regions having field-shield isolation. An important feature of the invention is drawn to creating structures wherein gate conductor is applied to a substrate including both above-surface and below-surface isolation regions in a manner which leaves the gate conductor planarized over both the above-surface and below-surface regions.
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申请公布号 |
US5606202(A) |
申请公布日期 |
1997.02.25 |
申请号 |
US19950428387 |
申请日期 |
1995.04.25 |
申请人 |
INTERNATIONAL BUSINESS MACHINES, CORPORATION |
发明人 |
BRONNER, GARY B.;MANDELMAN, JACK A. |
分类号 |
H01L21/76;H01L21/28;H01L29/06;H01L29/40;H01L29/423;H01L29/49;H01L29/78;(IPC1-7):H01L23/48 |
主分类号 |
H01L21/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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