发明名称 PROCESS FOR PREPARING THIN-FILM TRANSISTOR, PROCESS FOR PREPARING ACTIVE MATRIX SUBSTRATE, AND LIQUID CRYSTAL DISPLAY
摘要 A process for preparing a thin-film transistor (TFT) comprising a channel region connected to a source region and a drain region and a gate electrode facing the channel region through a gate insulating film, wherein, in the step of forming the gate insulating film, tetraethoxysilane is used as the raw material gas for feeding silicon and silicon oxide is formed by plasma chemical vapor deposition under such a condition that the distance between electrodes for generating plasma is not more than 15 mm. By virtue of this construction, a process for producing TFT can be provided which, despite a low-temperature process, can form a gate insulating film excellent in the behavior of charges and having a high quality on a large-area substrate in an even film thickness at a high film forming rate.
申请公布号 WO9706565(A1) 申请公布日期 1997.02.20
申请号 WO1996JP02211 申请日期 1996.08.05
申请人 SEIKO EPSON CORPORATION;ISHIGURO, HIDETO 发明人 ISHIGURO, HIDETO
分类号 C23C16/40;C23C16/509;H01L21/28;H01L21/336;H01L29/49;(IPC1-7):H01L29/786;H01L21/31;G02F1/136 主分类号 C23C16/40
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