发明名称 METHOD FOR DRYING WAFER.
摘要 A method of drying a wafer and performing perfect termination with hydrogen at the same time, by which a large number of wafers can be processed, the number of processings is decreased, and no contamination is caused. The method comprises the steps of mixing an inner gas and hydrogen gas to produce a mixed gas; producing hydrogen radicals by radicalizing hydrogen molecules contained in the mixed gas; introducing into a dry chamber a gas mixture containing hydrogen radicals; and drying wafers, cleaned by chemicals, by the gas mixture in the dry chamber and at the same time, terminating dangling bonds with hydrogen. <IMAGE>
申请公布号 EP0664558(A4) 申请公布日期 1997.02.19
申请号 EP19930921119 申请日期 1993.10.05
申请人 OHMI, TADAHIRO 发明人 OHMI, TADAHIRO
分类号 H01L21/304;F26B21/14;H01L21/00;H01L21/306 主分类号 H01L21/304
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