发明名称 FLUID SAMPLE METHOD X-RAY DIFFRACTOMETER
摘要 PROBLEM TO BE SOLVED: To obtain an X-ray diffraction spectrum required for identifying a material or elucidating a crystal structure by irradiating floating particles with X-rays. SOLUTION: Parallel X-rays are radiated at a divergent angle of <=10 milliradian toward the center of a container 2 containing a power sample 1 in a fluidized state through an incidence-side X-ray diverging angle limiter 3. Of the secondary X-rays generated from part of the sample 1 at an unspecified position, the parallel secondary X-rays diverged at an angle of <=10 milliradian in a designated direction are selectively transmitted through a receiving-side X-ray diverging angle limiter 4 which can be turned around the container 2. Therefore, an X-ray diffraction spectrum having an accurate reflecting intensity can be obtained, because the parallel secondary X-ryas which are emitted from crystal grains floating in unspecific azimuth and diverged at a angle of <=10 milliradian can be caught efficiently.
申请公布号 JPH0949810(A) 申请公布日期 1997.02.18
申请号 JP19950222551 申请日期 1995.08.08
申请人 NATL INST FOR RES IN INORG MATER 发明人 NAKAZAWA HIROMOTO;SHIMOMURA SHUICHI
分类号 G01N23/20;G01N23/207 主分类号 G01N23/20
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