| 摘要 |
The present invention relates to a process of automatic analysis of elements in weak concentration on a support of objects of low occurrence, having a high-contrast surface state, consisting of illuminating the observation zone with a first light source (5) emitting in a first wavelength range, and a second source (4) emitting in the excitation spectrum of the objects (23, 32) of low occurrence, proceeding to focus image acquisition means and after focusing triggering the accumulation of photons emitted by the objects (23, 32) of low occurrence illuminated with a source (4) emitting in the excitation spectrum of said objects (23, 32), characterized in that one proceeds to modify the focusing of the image aquisition means until maximization of the contrast of a zone (30) in said first wavelength range, said zone (30) being dissociatable from the observation zone illuminated from the second light source.
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