发明名称 |
Moire interferometry system and method with extended imaging depth |
摘要 |
A moire interferometry system and method are provided for achieving full field surface contouring with an extended depth of view of image. The moire interferometry system includes a projection system generally made up of a light source, imaging lens and a square wave grating pattern. The imaging lens is configured to filter higher order light rays passing through the square wave grating pattern so as to project a sine wave like pattern onto a desired surface. The moire interferometry system also includes a viewing system generally made up of an imaging lens, a submaster grating and a camera. The submaster grating is preferably a customized grating that may be produced by recording a grating pattern in relation to a reference surface. The camera is able to view an image anywhere within the extended depth of image and analyze the moire fringes. A determination of deviation between a test part and a reference surface provides a part inspection system. |
申请公布号 |
AU6499296(A) |
申请公布日期 |
1997.02.18 |
申请号 |
AU19960064992 |
申请日期 |
1996.07.17 |
申请人 |
INDUSTRIAL TECHNOLOGY INSTITUTE |
发明人 |
KEVIN G. HARDING |
分类号 |
G01B11/24;G01B11/25;G01N21/88;G06T1/00 |
主分类号 |
G01B11/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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