发明名称 SURFACE ANALYZER WITH PLASMA ETCHING UNIT
摘要 PROBLEM TO BE SOLVED: To selectively analyze existing molecule and functional group without damaging a material by being capable of analyzing the depthwise direction of an organic substance. SOLUTION: A plasma etching unit 8 is coupled to the sample inlet of a preliminary exhaust chamber 4, and a gate valve 7 for introducing or discharging a sample is disposed between the chamber 4 and the unit 8. The unit 8 has an etching tunnel 14 made of an electrode for generating a plasma to etch the sample placed at the center, sample introducing units 16, 17 for introducing the samples, a vacuum exhausting exhaust unit 12, and a sample base 11 for placing a sample holder 10 for holding the sample. The sample is repeatedly moved without exposing with the atmosphere between an analyzing chamber and the unit 8 via the valve 7, and the depth direction of the sample surface is analyzed while etching it.
申请公布号 JPH0943174(A) 申请公布日期 1997.02.14
申请号 JP19950193129 申请日期 1995.07.28
申请人 JEOL LTD;SHIN ETSU CHEM CO LTD 发明人 IIJIMA YOSHITOKI;OSHIMA MITSUYOSHI
分类号 G01N23/227;G01N1/32 主分类号 G01N23/227
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