发明名称 WAFER DIVIDING METHOD
摘要 <p>PROBLEM TO BE SOLVED: To prevent the extension of a crack from the adjacent initial cracks of a wafer narrow in dividing interval. SOLUTION: A plurality of initial cracks 12, 13-1 are formed to one side 11a of an almost square wafer 11 composed of a fragile material and the wafer 11 is irradiated with laser beam to be heated in the vicinity of the initial cracks 12, 13-1 and the initial cracks 12, 13-1 are advanced by heat stress to divide the wafer 11. In this method, a plurality of the initial cracks 12, 13-l are made different in length between the adjacent initial cracks. The vicinity of the long initial crack 13 among the adjacent initial cracks 12, 13-1 is prefentially heated by the irradiation with laser beam to advance a crack from the initial cracks 12, 13-1.</p>
申请公布号 JPH0938958(A) 申请公布日期 1997.02.10
申请号 JP19950192765 申请日期 1995.07.28
申请人 NEC KANSAI LTD 发明人 SAWADA HIROSHI
分类号 B26F3/16;B23K26/00;B28D5/00;H01L21/301;(IPC1-7):B28D5/00 主分类号 B26F3/16
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