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发明名称
METHOD AND APPARATUS FOR MEASURING THRESHOLD CHARACTERISTIC OF SEMICONDUCTOR INTEGRATED CIRCUIT
摘要
申请公布号
JPH0933618(A)
申请公布日期
1997.02.07
申请号
JP19950186051
申请日期
1995.07.21
申请人
SHARP CORP
发明人
NAGAHIRO MASAYUKI
分类号
G01R31/317;G01R31/28;G01R31/30;(IPC1-7):G01R31/317
主分类号
G01R31/317
代理机构
代理人
主权项
地址
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