发明名称 SEMICONDUCTOR IMPURITY SIMULATOR
摘要 PROBLEM TO BE SOLVED: To arrange even a less experienced process designer to keep calculation accuracy within a guaranteed range by sampling a processing process which affects an object simulation from input process data and preparing input data and thereby executing impurity simulation. SOLUTION: A sampling means 9, which is connected to a process data memory 12, samples a processing process, which affects an object simulation, from process data. An input data preparation means 10 prepares input data, which is used for the object simulation, from the sampled processing process and a process data memory 12. An input data memory 13 outputs the stored input data to an impurity simulator 6. The impurity simulator 6 simulates an impurity concentration distribution in a substrate.
申请公布号 JPH0936054(A) 申请公布日期 1997.02.07
申请号 JP19950186750 申请日期 1995.07.24
申请人 SONY CORP 发明人 TAKAHASHI SATOSHI
分类号 H01L21/22;G06F17/00;G06F19/00;G06Q50/00;G06Q50/04;H01L21/00;H01L21/265 主分类号 H01L21/22
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