发明名称 PROBE FOR MEASURING INSTRUMENT AND VOLTAGE MEASURING METHOD
摘要 <p>PROBLEM TO BE SOLVED: To achieve a reliable measurement from high to low frequency regions by eliminating such influence as the grounding, signal routing, and further probe capacitance which have been the problems in a conventional measurement probe and by the similar easiness of handing of a conventional measurement probe of an oscilloscope. SOLUTION: A voltage to be measured is applied to an electrode 45 of an optical modulator 4, the intensity of light which is changed by the optical modulator 4 while depending on the voltage to be measured is converted to an electrical signal by a photodetector 8, and the electrical signal is measured by an asymmetrical measuring instrument 12. The electrode 45 is constituted of a plurality of split electrodes 45a-45b which are divided in light-advancing direction and are mutually capacitively-coupled.</p>
申请公布号 JPH0933572(A) 申请公布日期 1997.02.07
申请号 JP19950179222 申请日期 1995.07.14
申请人 TOKIN CORP 发明人 KONDO MITSUKAZU
分类号 G01R15/24;G01R19/00;G01R29/08;G01R31/302;(IPC1-7):G01R19/00 主分类号 G01R15/24
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