发明名称 |
SEMICONDUCTOR STORAGE DEVICE |
摘要 |
<p>PROBLEM TO BE SOLVED: To prevent erroneous writing at erasure ending time without increasing erasing time by adding short-circuiting MOSFETs between data lines constituting a memory array and a source line. SOLUTION: A semiconductor storage device is provided with a data-line discharge circuit DC and short-circuiting MOSFETs which have large conductances and are selectively and simultaneously turned on upon receiving high-level short circuit control signals DE at erasure ending time between data lines D0-Dr constituting a memory array MARY and a source line SL. Therefore, a nonselected memory cell NC can be prevented from being set to a writing state, because the charges accumulated in the data line D1, etc., are mainly transferred to the source line SL through the short-circuiting MOSFFTs and the discharge current which is connected to a nonselected word line W1 and flows to the source line SL through the nonselected memory cell NC becomes a sufficiently small value.</p> |
申请公布号 |
JPH0936266(A) |
申请公布日期 |
1997.02.07 |
申请号 |
JP19960132743 |
申请日期 |
1996.04.30 |
申请人 |
HITACHI LTD;HITACHI VLSI ENG CORP |
发明人 |
ASADA EIJI;FURUNO TAKESHI;WADA MASASHI;KOSAKAI KENJI |
分类号 |
H01L21/8247;G11C16/02;G11C16/04;G11C16/06;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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