| 摘要 |
<p>A particle detector including electron multiplying means (14) generating a spray of electrons in response to the impact of each particle (2), a layer (6) extending through said spray and interacting therewith to emit a light pulse, and transparent electron detecting means (8) for determining the moment of impact of the particle and producing data on the impact positions for each determined moment, whereby said positions may be determined and correlated with the moments determined by the detecting means. Said detector may be used in atomic probes.</p> |
