| 摘要 |
A multi-pin probe including a printed circuit board with multiple electrically conductive vias, multiple probes, each probe inserted into one of the electrically conductive vias, and a housing having multiple cavities inserted over the multiple probes, each cavity having a first and a second aperture around one of the probes, the first aperture being smaller than the second aperture. In addition, a method of manufacturing a multi-pin probe including the steps of manufacturing a printed circuit board with multiple electrically conductive vias, inserting multiple probes into the electrically conductive vias, and inserting a housing having multiple cavities over the multiple probes, each cavity having a first and a second aperture around one of the probes, the first aperture being smaller than the second aperture.
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