| 摘要 |
<p>An X-ray examination apparatus (1) comprises a filter (4) which is arranged between the X-ray source (2) and the X-ray detector (3). The X-ray filter comprises a large number of filter elements (5); the X-ray absorptivity of said filter elements can be adjusted by controlling the quantity of X-ray absorbing liquid (6) in the filter elements. The filter elements are formed by metal capillary tubes, or the wall of the capillary tubes is provided with a metal layer (7). On the metal layer there is provided a dielectric layer (8) and the dielectric layer is covered by a coating layer (9). The dielectric layer is, for example a glass, parylene or polystyrene layer. The coating layer is, for example a Teflon, silane of siloxane layer. The dielectric layer can be dispensed with when a Teflon coating layer is used.</p> |
